By Leonard J. Brillson

"An crucial advisor to digital fabric Surfaces and Interfaces is a streamlined but entire creation that covers the fundamental actual houses of digital fabrics, the experimental suggestions used to degree them, and the theoretical equipment used to appreciate, are expecting, and layout them. beginning with the basic digital houses of semiconductors and electric measurements of Read more...

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a vital consultant to digital fabric Surfaces and Interfaces is a streamlined but entire advent that covers the elemental actual homes of digital fabrics, the experimental Read more...

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The effective barrier is lowered from q????SB0 to ????SB with an applied electric field. M. 2007 [8]. 12) so that the barrier ????SB0 can be extracted from a plot of ln J versus applied forward voltage. 13) are much less than one so that n ≈ 1. However, a variety of physical processes can increase n. These include tunneling through the barrier [9,10], intermediate layers with new dielectric and transport properties [10,11], and recombination or trapping at states near the interface and within the semiconductor band gap [11].

Later chapters will describe the range of techniques available to measure these and related properties at the microscopic and atomic scale where the physical mechanisms that determine these properties take place. 1 Sheet Resistance and Contact Resistivity Macroscopic techniques to measure properties of surfaces and interfaces begin by taking into account the semiconductor’s sheet resistance and its metal contact resistivity. Two-terminal electrical measurements of Schottky barriers and heterojunction band offsets involve applied voltages that fall not only across the interface under test but also across the series resistances between the voltage terminals and the interface.

2. D. (1976) Some optical properties of the Alx Ga1−x As alloy system. J. Appl. , 47, 2604. , Resnick, R. and Walker, J. , New York, Ch. 42. 3 Electrical Measurements of Surfaces and Interfaces This chapter describes the techniques available to characterize the electrical properties of surfaces and interfaces at the macroscopic level. Included are methods to determine: (i) sheet resistance across electronic material surfaces, (ii) contact resistance of non-rectifying metal contacts to these surfaces, (iii) Schottky barrier heights of rectifying contacts, and (iv) heterojunction band offsets.

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